Archive (at least one year old)
Mikroniek editions of more than one year old can be downloaded here. Recent Mikroniek editions are reserved for members (printed or online version). Only previews of recent editions are available to download.
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References
![](https://www.dspe.nl/wp-content/uploads/2024/07/DSPE-site_Virtual_play_-_Figure_1_c1-460x259.jpg)
For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.
Read more![](https://www.dspe.nl/wp-content/uploads/2024/07/DSPE-site_Clean_Event_and_MTC_report_-_Figure_10_53670603996_1b737d2cf2_o1-460x259.jpg)
In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).
Read more![](https://www.dspe.nl/wp-content/uploads/2024/07/DSPE-site_Fastmicro_PFS_-_Figure_3_Particle_Fallout_Scanner_product_photo_c1-460x259.jpg)
Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.
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