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      ARCHIVE
    MIKRONIEK
    • MIKRONIEK ARCHIVE
      • INTRODUCTION
        • 1.1 TEMPERATURE, HEAT AND HEAT CAPACITY
          • CONDUCTION
          • CONVECTION
          • RADIATION
          • THERMAL CONTACT CONDUCTION
          • OVERVIEW OF THERMAL COUPLINGS
          1.2 HEAT TRANSFER
        • 1.3 PRINCIPLES OF THERMAL DEFORMATION
          • PROBLEM 1: FIXED-FREE BEAM
          • PROBLEM 2: FIXED-GUIDED-IN-Y BEAM
          • PROBLEM 3: FIXED-FIXED BEAM
          • PROBLEM 4: FIXED-GUIDED-IN-X BEAM
          • PROBLEM 5: FIXED-SIMPLE SUPPORTED BEAM
          • PROBLEM 6: SIMPLE SUPPORTED-GUIDED-IN-X BEAM
          • PROBLEM 7: SIMPLE SUPPORTED BEAM
          1.4 THERMO-MECHANICAL BEAM EQUATIONS ("VERGEET-MIJ-NIETJES")
        CHAPTER 1 - BASICS
          • 2.4.1 BASICS
          • 2.4.2 RADIATIVE EXCHANGE
            • NEAR BLACK SURFACES
            • TWO SURFACES FACING EACH OTHER
            • NUMERICAL EXAMPLE
            2.4.3 GEBHART METHOD
            • NUMERICAL EXAMPLE
            2.4.4 NET-RADIATION METHOD
          • 2.4.5 REFERENCES
          2.4 THERMAL RADIATION
        CHAPTER 2 - IN DEPTH
        • 3.1 MATERIAL SELECTION
        • 3.2 GEOMETRY
        • 3.3 DESIGN PRINCIPLES
        • 3.4 PASSIVE THERMAL CONDITIONING
        • 3.5 ACTIVE THERMAL CONDITIONING
        • 3.6 COMPENSATION
        • 3.7 SUMMARY
        • 3.8 REFERENCES
        CHAPTER 3 - DESIGN
        • 4.1 IMPORTANT VARIABLES
        • 4.2 LUMPED CAPACITANCE MODELING
        • 4.3 ADVANCED HAND CALCULATIONS
        CHAPTER 4 - MODELING
        • 5.1 CONTACTLESS TEMPERATURE SENSORS
          • 5.2.1 THERMOCOUPLES
          • 5.2.2. RESISTANCE THERMOMETERS PTC
          • 5.2.3 RESISTANCE THERMOMETERS PRT
          • 5.2.4 PTC THERMISTOR (ALIAS POSISTOR)
          • 5.2.5 RESISTANCE THERMOMETERS NTC
          • 5.2.6 SEMICONDUCTOR TEMPERATURE SENSORS
          • 5.2.7 OTHER TYPES OF CONTACT SENSORS
          5.2 CONTACT SENSORS
        CHAPTER 5 - MEASUREMENT
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Displaying 1 to 10 from 843 articles total
TitleSourceDate
Ultra-precise digitisation of astrometric platesMikroniek 2010-66 May 2012
Statically-balanced compliant micromechanismsMikroniek 2010-66 May 2012
High-speed millingMikroniek 2010-66 May 2012
High-resolution capacitive sensorMikroniek 2010-66 May 2012
Symposium on micro- and precision machiningMikroniek 2010-66 May 2012
Manufacturer of measuring instruments, MitutoyoMikroniek 2010-48 April 2012
Piezoelectric thin-film characterization for MEMSMikroniek 2010-48 April 2012
Euspen 10th International ConferenceMikroniek 2010-48 April 2012
X-rays measure inside objectsMikroniek 2010-48 April 2012
Variable stiffness actuatorsMikroniek 2010-58 April 2012
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