Factsheet, IOP NANOMEFOS

Om de absolute vorm van freeform en asferische optische oppervlakken te kunnen verifiëren, is een systeem nodig dat deze nauwkeurig kan meten. In deze lacune is voorzien door het IOP-project NANOMEFOS (Nanometer Accuracy NOn-contact MEasurement of Freeform Optical Surfaces). TNO heeft de gelijknamige meetmachine inmiddels in gebruik genomen, en is er een commercialisatietraject voor gestart. De universele contactloze meetmachine kan free-form optische oppervlakken tot 500 mm diameter meten met een meetonzekerheid van 30 nanometer.

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References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.