Colourmap the absolute XYA scale

Electronics Micro system technology MEMS/NEMS Optics
Mikroniek 2009-1 by Gavin Bailey 13 June 2011

ColourmapTM dot scale technology is a patented, absolute XY and angle scale system. A matrix of coloured dots is used to encode both X and Y positions. At any position on the scale the pattern of coloured dots will be unique, allowing X and Y positions and the angle of the sensor to be calculated. Because the angle of the sensor is also measured, there is no need to constrain the moving element orthogonally. This means that the system could potentially revolutionise current thinking with regard to applications that require two-dimensional measurements.


References

Lunch Lecture December hosted by…

Due to private circumstances the lunch lecture will be cancelled today. More information about when we organize this lecture again will follow soon.

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Company visit YPN at Settels…

Our next company visit has been confirmed and will take place at Settels Savenije, located in Eindhoven, on Tuesday 17th of December. A perfect opportunity for networking just before Christmas.

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Jan-Pieter Rijstenbil (TU Eindhoven) receives…

Prize for careful process analysis and early validation. During the 23rd edition of the Precision Fair in Den Bosch (NL), the Wim van der Hoek Award was presented under the auspices of DSPE (Dutch Society for Precision Engineering).

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