NEWS 15 November 2018

Wim van der Hoek Award 2018 presented to Martin Kristelijn (TUe)

During the 18th edition of the Precision Fair, the Wim van der Hoek Award 2018 was presented under the auspices of the DSPE (Dutch Society for Precision Engineering). The prize...


During the 18th edition of the Precision Fair, the Wim van der Hoek Award 2018 was presented under the auspices of the DSPE (Dutch Society for Precision Engineering). The prize went to Martin Kristelijn, who graduated from Eindhoven University of Technology on a well-elaborated and clearly presented design of a motion-compensation and load-transfer mechanism for application in the offshore industry.

 

“Seemingly easy”
Following a careful assessment, the Wim van der Hoek Award 2018 went to Martin Kristelijn, who studied Mechanical Engineering at Eindhoven University of Technology. This spring he graduated with the design of a motion-compensation and load-transfer mechanism for application in the offshore industry (for payloads up to 1,000 metric tons). The panel of judges described his design as well elaborated and succinctly but clearly presented. “Martin Kristelijn correctly combined the relevant construction principles for his design and analysed the degrees of freedom in the right manner. He provides real insight with ‘back of an envelope’ calculations, step by step, so well that it becomes seemingly easy. He involves the reader in his reasoning and thus delivers excellent communication.”

 

 

Martin Kriselijn (right) has received the Wim van der Hoek Award 2018 certificate from DSPE board member Jos Gunsing. (Photo: Mikrocentrum)

 


References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

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In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

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Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

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