NEWS 2 November 2026
Towards scalable testing of superconducting quantum chips
Quantum processors need more than good qubits. They also need equipment that can test many devices efficiently at their operating temperature.
To address this challenge, JPE is developing a cryogenic probe system for wafer-level quantum-chip testing below 100 mK, enabling more scalable and cost-effective characterisation of quantum devices. The system builds on JPE’s experience in precision positioning, cryogenic mechatronics and complex system development. The integration with a dilution refrigerator platform is being investigated within a joint R&D effort with Bluefors, as decribed in this Mikroniek article. (Photo courtesy of JPE)
