NEWS 8 September 2022

Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Linkam Scientific Instruments and Sensofar Metrology demonstrate an experimental set-up in which these problems have been minimised, as described in this Mikroniek article. Using Linkam’s precision temperature control chamber with Sensofar’s Linnik objective lens allows accurate measurement of 3D topographic profiles of nanoscale materials. As an example, the changes in the topography of silicon wafers as they evolve with temperatures from 20 up to 380 °C are presented. (Image courtesy of Sensofar)


YPN visit IBS precision engineering…

We will visit IBS Precision Engineering, located in Eindhoven. IBSPE has been helping customers address unique problems for over 30 years. With their expert knowledge in metrology, they understand the true meaning of ultra precision engineering.

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Lunch Lecture June hosted by…

Development of a Fully Autonomous Tractor for Sustainable Agriculture

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Report of the successful DSPE…

Last month, the DSPE Optomechatronics Week 2023 was a great success. Preceded by a fully booked three-day Optomechanical System Design course, the DSPE Optomechatronics Symposium on Thursday 30 March attracted about 100 participants.

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