NEWS 8 September 2022

Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.


Linkam Scientific Instruments and Sensofar Metrology demonstrate an experimental set-up in which these problems have been minimised, as described in this Mikroniek article. Using Linkam’s precision temperature control chamber with Sensofar’s Linnik objective lens allows accurate measurement of 3D topographic profiles of nanoscale materials. As an example, the changes in the topography of silicon wafers as they evolve with temperatures from 20 up to 380 °C are presented. (Image courtesy of Sensofar)


References

Picometer drift and microrad reproducibility

At the end of May, Settels Savenije hosted a DSPE Knowledge Day dedicated to challenges in nanometrology.

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Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

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Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

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