NEWS 13 August 2020

Mikroniek October: Precision sensors and Precion Fair preview

The October issue of Mikroniek, click here for a first impression, features the theme of Precision sensors. It covers the design of a positioning platform for nano-precision high-throughput metrology based...


The October issue of Mikroniek, click here for a first impression, features the theme of Precision sensors. It covers the design of a positioning platform for nano-precision high-throughput metrology based on magnetic levitation; volumetric compensation of high-precision 6-axis grinding machines; and a pleading for a total calibration framework for optical surface and coordinate measuring instruments. Off-topic features include Topology Optimisation with thermal constraint for improving the manufacturability of metal AM parts; the nominations for the 2019 Wim van der Hoek Award; and the preview of the Precision Fair 2019, including general info, exhibitor list, floor plan and an innovation display.

 

Please send an e-mail for information on how to obtain a hardcopy of the April edition.

 

 


References

Call for abstracts! DSPE Conference…

The call for abstracts is open until 15 February 2025.

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Lunch lecture November hosted by…

The title of this lunch lecture is: Potential of fault diagnosis and predictive maintenance for precision mechatronics

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QUADRA: metrology for the ongoing…

The semiconductor roadmap is currently fuelled by innovations along three trends

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