NEWS 3 July 2024

Mikroniek July 2024: Micromanufacturing

The July issue of Mikroniek is devoted to micromanufacturing. The main theme feature presents a particle contamination monitoring and control solution as a crucial prerequisite for micromanufacturing processes.


Other theme articles include an update of developments in photochemical etching and a report of the combined Clean Event 2024 and Manufacturing Technology Conference 2024, which featured a joint keynote presentation about the high-vacuum material challenges at CERN. Also in this issue, a resolution of the confusion in design principles literature about hysteresis curves and virtual play, and a report of the DSPE Knowledge Day Beyond Nanometrology. Click here for a first impression. (Cover image courtesy of CERN).


References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

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Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

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Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

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