Mikroniek July 2024: Micromanufacturing
The July issue of Mikroniek is devoted to micromanufacturing. The main theme feature presents a particle contamination monitoring and control solution as a crucial prerequisite for micromanufacturing processes.
Other theme articles include an update of developments in photochemical etching and a report of the combined Clean Event 2024 and Manufacturing Technology Conference 2024, which featured a joint keynote presentation about the high-vacuum material challenges at CERN. Also in this issue, a resolution of the confusion in design principles literature about hysteresis curves and virtual play, and a report of the DSPE Knowledge Day Beyond Nanometrology. Click here for a first impression. (Cover image courtesy of CERN).
