NEWS 18 March 2021

Mikroniek February 2021: High-tech systems input from NFI and PI

The February issue of Mikroniek features the theme of high-tech systems. The cover story by Nearfield Instruments (NFI) is about the agile systems engineering approach towards high-throughput 3D metrology equipment...

Julie van Stiphout - Sassen

The February issue of Mikroniek features the theme of high-tech systems. The cover story by Nearfield Instruments (NFI) is about the agile systems engineering approach towards high-throughput 3D metrology equipment for semiconductor process control. PI (Physik Instrumente) reports on improving hexapod positioning performance through compensation for mechanical compliance in parallel kinematics. Two manufacturing-centred articles focus on progress in laser fabrication technology and additive manufacturing of Porsche engine pistons, respectively. Click here for a first impression of the issue. (The cover image by Tim van der Steen, featuring the Quadra high-throughput scanning probe metrology system, is courtesy of Nearfield Instruments.)


References

Mikroniek September: DSPE Conference catalogue…

The forthcoming Mikroniek issue, click here for a first impression, will appear on 16 September. In part dedicated to the DSPE Conference on Precision Mechatronics, it comprises the conference programme,...

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Wim van der Hoek Award…

During the 18th edition of the Precision Fair, the Wim van der Hoek Award 2018 was presented under the auspices of the DSPE (Dutch Society for Precision Engineering). The prize...

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Mikroniek: Merging systems architecture and…

In recent years, systems engineering (SE) is becoming more important in the Dutch high-tech equipment industry. Increasing system complexity and increasing team sizes put more emphasis on the explicit coordination...

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