NEWS 19 December 2021

Mikroniek December 2021: Contamination

The December issue of Mikroniek features the theme of Contamination. The main feature is the ACCESS project: Active Contamination Control for Equipment and Substrates.


In this project, VDL ETG and Eindhoven University of Technology work together as a multidisciplinary team, to deepen the fundamental understanding of generation, transport and removal of particle contamination. In addition, several articles present solutions for measuring contamination (in vacuum). The issue – click here for an impression – also runs several reports, of the DSPE Knowledge Day Engineering for Contamination Control, the Precision Fair 2021, and the Gas Bearing Workshop 2021. (Combined images, courtesy of Fastmicro and TNO)


References

Our DSPE chairman Hans Krikhaar…

𝗪𝗲 𝗮𝗿𝗲 𝗽𝗿𝗼𝘂𝗱 𝘁𝗼 𝗮𝗻𝗻𝗼𝘂𝗻𝗰𝗲 𝘁𝗵𝗮𝘁 𝗗𝗦𝗣𝗘 𝗣𝗿𝗲𝘀𝗶𝗱𝗲𝗻𝘁 𝗛𝗮𝗻𝘀 𝗞𝗿𝗶𝗸𝗵𝗮𝗮𝗿 𝗵𝗮𝘀 𝗿𝗲𝗰𝗲𝗶𝘃𝗲𝗱 𝗮 𝗚𝗲𝗿𝗮𝗿𝗱 & 𝗔𝗻𝘁𝗼𝗻 𝗛𝗶𝗴𝗵 𝗧𝗲𝗰𝗵 𝗦𝘁𝗮𝗿 𝗔𝘄𝗮𝗿𝗱 𝟮𝟬𝟮𝟲!

Read more
Lunch lecture February hosted by…

Title: Piezoelectric wafer stage – for electron beam inspection systems

Read more
Sensitivity analysis in Opto-Mechanical System…

As a mechatronics engineer at VDL ETG Technology & Development in Almelo (NL), Leon Nijenhuis got involved with opto-mechanics when working on aerospace projects. One of his duties was the design of an alignment tool for laser satellite communication.

Read more