NEWS 2 November 2021

DSPE Program during the Precision Fair 2021

About the 20th edition of the Precision Fair From micrometer to picometer. The demand for even more accurate and smaller measurements, production and construction has been increasing unabated for years....


About the 20th edition of the Precision Fair

From micrometer to picometer. The demand for even more accurate and smaller measurements, production and construction has been increasing unabated for years. Products and technologies are also becoming increasingly complex and smarter. Precision technology has therefore rapidly developed into the stable basis for many devices and components around us.

20 years of Precision Fair is 20 years of technological progress through meeting, collaborating and sharing knowledge.

As the annual meeting point for the high-tech industry, the Precision Fair has been the platform for developments in precision technology for 20 years. However, the limit is not long reached. Meeting, collaborating and sharing knowledge are indispensable for innovation and economic growth. During this anniversary edition, we will take you on a journey through the past, the present and the future.

DSPE program during the fair

  • Location: Hal 2 Networking Café Standnumber 404

Wednesday November 10

  • 12:00 – 14:00 DSPE ALV (only for DSPE members)
  • 16:30 – 17:00 Ir. A. Davidson award

Thursday November 11

  • 16:00 Wim van der Hoek award

Click here for your registration.


References ...

DSPE Opto-Mechatronics Symposium 2026

The seventh edition of the DSPE Opto-Mechatronics Symposium will take place on 8 October 2026. This year’s theme is ‘The opto-mechatronics of telescopes: from tiny to extremely large’.

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DSPE and LiS join forces

SDPE supports the nationwide expansion of the Leidse instrumentmakers School (LiS) to strengthen the pipeline of precision manufacturing professionals in the Netherlands.

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Structure-preserving model reduction

High-precision machines are often modelled as assemblies of flexible substructures, which preserves physical insight but leads to models that are too large for efficient dynamic analysis and control design.

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