NEWS 23 April 2023

Combining sensors and interferometers for nanometrology

A nanomeasuring and nanopositioning machine/platform, in combination with an atomic force microscope,

an optical sensor or a microprobe, can be used to perform high-precision free-form surface measurements as well as three-dimensional scanning and tactile measurements on microcomponents, as described in this Mikroniek article. Uncertainties in the nanometer range are achievable, and the use of laser interferometers for position measurement allows traceability of measurements for the purpose of sensor calibration. (Image courtesy of SIOS Meßtechnik)

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References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.