NEWS 23 April 2023

Combining sensors and interferometers for nanometrology

A nanomeasuring and nanopositioning machine/platform, in combination with an atomic force microscope,

an optical sensor or a microprobe, can be used to perform high-precision free-form surface measurements as well as three-dimensional scanning and tactile measurements on microcomponents, as described in this Mikroniek article. Uncertainties in the nanometer range are achievable, and the use of laser interferometers for position measurement allows traceability of measurements for the purpose of sensor calibration. (Image courtesy of SIOS Meßtechnik)


YPN visit IBS precision engineering…

We will visit IBS Precision Engineering, located in Eindhoven. IBSPE has been helping customers address unique problems for over 30 years. With their expert knowledge in metrology, they understand the true meaning of ultra precision engineering.

Read more
Lunch Lecture June hosted by…

Development of a Fully Autonomous Tractor for Sustainable Agriculture

Read more
Report of the successful DSPE…

Last month, the DSPE Optomechatronics Week 2023 was a great success. Preceded by a fully booked three-day Optomechanical System Design course, the DSPE Optomechatronics Symposium on Thursday 30 March attracted about 100 participants.

Read more