AI-driven visual inspection of photonic wafers

These devices form the backbone of technologies ranging from high-speed communication systems to cutting-edge sensors. Defect inspection on photonic wafers involves sophisticated techniques and technologies designed to identify and mitigate imperfections that could compromise device functionality. This Mikroniek article explores the various techniques used in defect inspection, the challenges encountered, and the latest advancements that are enhancing the accuracy and efficiency of these processes. (Image courtesy of Nobleo)