NEWS 16 February 2021

Agile systems engineering approach towards high-throughput 3D metrology equipment for semiconductor process control

In the semiconductor industry, Moore’s law comes with increasing and complex demands and the need for advanced process control metrology. Nearfield Instruments fulfils these needs with their high-throughput scanning probe...


In the semiconductor industry, Moore’s law comes with increasing and complex demands and the need for advanced process control metrology. Nearfield Instruments fulfils these needs with their high-throughput scanning probe metrology (HT-SPM) systems. January 2018, they started working on their first product, QUADRA. By rigorously adhering to an agile systems engineering methodology and promoting the concept of a minimum viable product, as described in this Mikroniek article, Nearfield Instruments was able to develop, integrate, test, and subsequently ship their first QUADRA to a major semiconductor fab in December 2020.


References

New event: Café Eureka for…

Café Eureka offers Young Professionals the place to be together and to gain experiences with an interactive interview with an inspiring guest. 3 July 2025 at Effenaar Eindhoven. Feel free to join this new event.

Read more
Lunch Lecture June hosted by…

Titel: Modular Reduction of Large-Scale Assembly Models

Read more
DSPE Conference 2025

In 2025, the DSPE Conference on Precision Mechatronics will take place on 23-24 September. Once again, the stage will be set in hotel De Ruwenberg in Sint-Michielsgestel (NL), which at previous DSPE conferences provided an inspiring and relaxed atmosphere for…

Read more