EVENT 11 August 2020

YPN visist Thermo Fisher Scientific Electron Microscopy Solutions

About this event

14 March 2019

References

Wim van der Hoek Award…

First Belgian winner of Dutch design engineering award At the seventeenth edition of the Precision Fair, held on 15 and 16 November in Veldhoven, the Netherlands, DSPE (Dutch Society...

Mikroniek December issue: ‘Precision in…

The December issue of Mikroniek, click here for a first impression, features the theme of ‘Precision in Agro’ and includes articles on the research at famous agricultural knowledge institutes such...

DSPE Knowledge day November 23…

On 23 November DSPE will organize the Knowledge day Engineering for Contamination Control. This DSPE event is organized in collaboration with VCCN (Association of Contamination Control Netherlands), VDL ETG, Settels...

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References

Mikroniek December: Software & machine…

The December issue of Mikroniek, click here for a first impression, features the theme of Software & machine learning. It covers applications in system control, surface metrology and mechanism design....

Lunch Lecture March hosted by…

Development of the SPEXone spectropolarimeter instrument, the Dutch contribution to the NASA PACE satellite observatory By Alexander Eigenraam, senior mechanical design engineer at SRON Netherlands Institute for Space Research SPEXone...

Large dynamic range atomic force…

In semiconductor manufacturing, the shrink following Moore’s law requires ever tighter overlay and registration between the different (material) layers. For accurately characterising this overlay and registration, TNO has developed a...