Symposium From Measuring to Knowledge
Especially for alumni of the Leidse instrumentmakers School (LiS), 14.00 – 18.30 Speakers: 1) Jan Sturre of Heidenhain with “Direct position feedback versus indirect position feedback”2) Frans-Peter d’Hooghe of...
About this event
Especially for alumni of the Leidse instrumentmakers School (LiS),
14.00 – 18.30
Speakers:
1) Jan Sturre of Heidenhain with “Direct position feedback versus indirect position feedback”
2) Frans-Peter d’Hooghe of Mitutoyo with “Coordinates measuring machine and Industrie 4.0”
3) Wiebe Heidema of Össur met “Measuring is knowing: the human brain”
4) Xander Janssen of VDL Enabling Technologies Group Eindhoven with “Knowledge leads to more specific measuring: the measuring of submicron phenomena with the largest instruments of the world”
5) Marijn van Veghel of VSL Dutch Metrology Institute with “Reliable metrology for industrial sensing”
Location:
Leidse instrumentmakers School
Einsteinweg 61
2333CC Leiden
Registration (required) via alumni@lis.nl
References
Theme: Concept optimization of system dynamics of a lithography tool.
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Paralleling the historical beginnings of modern science, assessing and addressing variation in physical systems constitutes the foundation of precision engineering. Tycho Brahe gave us the measurement data to analyse the heavens.
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As technology reaches the atomic and quantum scale, sub-nanometer motion control is no longer optional – it is a necessity, often in vacuum environments where even the smallest disturbances are effectively suppressed.
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