EVENT 11 August 2020
Symposium From Measuring to Knowledge
Especially for alumni of the Leidse instrumentmakers School (LiS), 14.00 – 18.30 Speakers: 1) Jan Sturre of Heidenhain with “Direct position feedback versus indirect position feedback”2) Frans-Peter d’Hooghe of...
About this event
Especially for alumni of the Leidse instrumentmakers School (LiS),
14.00 – 18.30
Speakers:
1) Jan Sturre of Heidenhain with “Direct position feedback versus indirect position feedback”
2) Frans-Peter d’Hooghe of Mitutoyo with “Coordinates measuring machine and Industrie 4.0”
3) Wiebe Heidema of Össur met “Measuring is knowing: the human brain”
4) Xander Janssen of VDL Enabling Technologies Group Eindhoven with “Knowledge leads to more specific measuring: the measuring of submicron phenomena with the largest instruments of the world”
5) Marijn van Veghel of VSL Dutch Metrology Institute with “Reliable metrology for industrial sensing”
Location:
Leidse instrumentmakers School
Einsteinweg 61
2333CC Leiden
Registration (required) via alumni@lis.nl
References
Order of frictions and stiffnesses…
For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.
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Make it clean
In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).
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Bringing particles to light
Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.
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