EVENT 12 October 2021

Knowledge Day Engineering for Contamination Control November 23 2021

On 23 November DSPE will organize the Knowledge day Engineering for Contamination Control. This DSPE event is organized in collaboration with VCCN (Association of Contamination Control Netherlands), VDL ETG, Settels...


About this event

On 23 November DSPE will organize the Knowledge day Engineering for Contamination Control. This DSPE event is organized in collaboration with VCCN (Association of Contamination Control Netherlands), VDL ETG, Settels Savenije Group of Companies, OMNEO Systems, Lans Engineering, Fast Micro, and TNO.

The DSPE Knowledge Day on Engineering for Contamination Control is devoted to design aspects aimed at dealing with contamination or minimizing the implications of contaminations. In addition, information will be shared regarding tools that support the design (and test) phase of a project.

The event is highly relevant for precision engineers involved in designing advanced mechtronics systems.

Location:

Mikrocentrum, De Run 1115, 5503 LB Veldhoven

Programme:

13:00 Doors open
13:30 – 13:45 Welcome by DSPE + introduction DSPE + introduction VCCN
13:45 – 14:20 Cees van Duijn (OMNEO Systems)
14:20 – 14:55 Paul Blom (VDL ETG)
14:55 – 15:20 Break
15:20 – 15:55 Rob Lansbergen (Lans Engineering) and Erik Vermeulen (Fast Micro)
15:55 – 16:30 Sven Pekelder and Jasper Smit (Settels Savenij Group of Companies)
16:30 – 16:45 Freek Molkenboer (TNO)
16:45 – 17:00 Wrap up
17:00 End

You can register for this knowledge day by sending an email to info@dspe.nl.


23 November 2021


The Netherlands

Mikrocentrum, de Run 1115 Veldhoven


References

A flexible way to reflect…

The W.M. Keck Observatory telescopes on Hawaii are receiving upgrades that include an Adaptive Secondary Mirror (ASM) and the Keck Wide Field Imager (KWFI).

Read more
AI-driven visual inspection of photonic…

In the rapidly evolving field of photonics, the integrity of photonic wafers is paramount to the performance and reliability of optical devices.

Read more
Designing better with additive manufacturing

In the area of precision engineering – where tolerances are measured in microns or even nanometers – additive manufacturing (AM) offers a new level of possibility.

Read more

References

A flexible way to reflect…

The W.M. Keck Observatory telescopes on Hawaii are receiving upgrades that include an Adaptive Secondary Mirror (ASM) and the Keck Wide Field Imager (KWFI).

Read more
AI-driven visual inspection of photonic…

In the rapidly evolving field of photonics, the integrity of photonic wafers is paramount to the performance and reliability of optical devices.

Read more
Designing better with additive manufacturing

In the area of precision engineering – where tolerances are measured in microns or even nanometers – additive manufacturing (AM) offers a new level of possibility.

Read more