EVENT 11 August 2020

ASPE 2020 Spring Topical Meeting

Massachusetts Institute of Technology Cambridge, Massachusetts, USA Meeting Co-chairpersons David L. Trumper, Massachusetts Institute of Technology Chinedum Okwudire, University of Michigan Dick Laro, MI-Partners Wouter Hakvoort, University of Twente  ...


About this event

Massachusetts Institute of Technology

Cambridge, Massachusetts, USA

Meeting Co-chairpersons
David L. Trumper, Massachusetts Institute of Technology
Chinedum Okwudire, University of Michigan
Dick Laro, MI-Partners
Wouter Hakvoort, University of Twente

 

The American Society for Precision Engineering is holding its sixth topical meeting on the design and control of precision mechatronic systems. The conference solicits papers in theory and applications of control with a focus on achieving high precision in research efforts and in industrial applications. The use of precision control is of particular current interest, given the increasing use of mechatronic solutions in many fields with very high performance requirements, especially in the context of the so-called fourth industrial revolution (aka Industry 4.0 or IIoT).

 

12 Student Scholarships!

With the generous support of the ASML company, there will be 12 student scholarships to award to students who are submitting and selected to present a paper at the 2020 ASPE Spring Topical Meeting on the Design and Control of Precision Mechatronic Systems. These scholarships will cover the cost of conference registration for the spring topical meeting. Students selected will be able to attend the conference without paying the registration fee.

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Paper Submission Schedule:

• January 15: Short abstract due
• February 1: Paper acceptance
• March 15: Extended abstracts due

 

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6 May 2020


The Netherlands



References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

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Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more

References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more