EVENT 11 August 2020

Annual Meeting American Society for Precision Engineering ASPE

32th edition of the Annual Meeting of the ASPE. Conference Chair: Vivek G. Badami, Zygo Corporation   The Westin CharlotteCharlotte, North Carolina, USA   More info http://aspe.net/


About this event

32th edition of the Annual Meeting of the ASPE.

Conference Chair: Vivek G. Badami, Zygo Corporation

 

The Westin Charlotte
Charlotte, North Carolina, USA

 

More info http://aspe.net/


29 October 2017



References

Jan-Pieter Rijstenbil (TU Eindhoven) receives…

Prize for careful process analysis and early validation. During the 23rd edition of the Precision Fair in Den Bosch (NL), the Wim van der Hoek Award was presented under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more
Bert Brals (Sioux Technologies) receives…

Creative inventor, collaborating foreman and true teacher. During the 23rd edition of the Precision Fair, the Rien Koster Award was presented for the tenth time under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more
Wim van der Hoek Award…

This year, the jury has received four nominations for students who applied existing or new design principles in their graduation work in an exciting manner.

Read more

References

Jan-Pieter Rijstenbil (TU Eindhoven) receives…

Prize for careful process analysis and early validation. During the 23rd edition of the Precision Fair in Den Bosch (NL), the Wim van der Hoek Award was presented under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more
Bert Brals (Sioux Technologies) receives…

Creative inventor, collaborating foreman and true teacher. During the 23rd edition of the Precision Fair, the Rien Koster Award was presented for the tenth time under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more
Wim van der Hoek Award…

This year, the jury has received four nominations for students who applied existing or new design principles in their graduation work in an exciting manner.

Read more