NEWS 16 December 2022

Molecular contamination control enables the ‘big enabler’ – vacuum

Chemical or molecular contaminants are harmful in vacuum applications because they disturb the operation, which can lead to lower production yield or faulty measurements.


For example. Molecular contamination can be prevented by using suitable materials and clean gases, and by ensuring that parts are properly cleaned, manufactured, assembled and inspected. These issues were the focus of the DSPE Knowledge Day Molecular Contamination Control, hosted by TNO in early November. The report of the event in this Mikroniek article features presentations from the semicon, space and analytical industries, as well as a tour of TNO research facilities, including the advanced EBL2 (EUV Beam Line 2). (Image courtesy of Thermo Fisher Scientific)


References

Techcafé about Predictive maintenance

February 9 at Mikrocentrum. This event is organized in Dutch

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Call for abstracts DSPE Conference…

The organizing committee invites you to submit a short abstract for a 20 minutes presentation and publication in the conference proceedings. Note that due to the limited number of presentations, it may be necessary to change the status from paper…

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Optomechatronics Symposium 2023 March 30

This symposium is intended for engineers and architects participating in or interested in the design and building of optical hardware. It is a great moment to network, to meet technical peers, and to visit the expo.

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