Bringing particles to light
Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.
By implementing cleanroom environments in combination with continuous particle deposition monitoring, manufacturers can design closed-loop clean process validation and process improvement procedures to prevent particle defects that lead to yield losses. This Mikroniek article introduces technology for cleanroom validation and qualification on the workspace where it really matters, using a Particle Fallout Scanner (PFS) that continuously measures particles falling onto critical target surfaces. (Image courtesy of Fastmicro).
