EVENT 11 August 2020

YPN visit 2015 Demcon

Program: 13:30-13:45: Welcome 13:45-13:50: Opening 13:50-14:00: Introduction Demcon 14:00-14:30: Handling vibrations in very low-flow Coriolis mass flow measurement 14:30-15:00: Tool for in-field placement of glass fibre connectors 15:00-15:30: Wafer stage...


About this event

Program:

13:30-13:45: Welcome
13:45-13:50: Opening
13:50-14:00: Introduction Demcon
14:00-14:30: Handling vibrations in very low-flow Coriolis mass flow measurement
14:30-15:00: Tool for in-field placement of glass fibre connectors
15:00-15:30: Wafer stage development: nanomenter accuracy in ultra high vacuum
15:30-16:00: Hand scanner for detection of Rheumatoid Arthritis (RA)
16:00-16:20: Lab tour
16:20-17:00: Drinks

 

 

Registration: Free of charge, send a email to: e.j.c.bos@tue.nl or Edwin.Bos@XpressPE.com.
Visiting address: DEMCON, Institutenweg 25, 7521 PH Enschede


11 February 2015


The Netherlands



References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Read more
Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Read more
Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

Read more

References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Read more
Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Read more
Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

Read more