EVENT 11 August 2020

Precision in Business day at VDL ETG

It is not possible anymore to register for this PiB day. We reach the max of 40.   PROGRAM 13.30 Arrival and registration      14.00 Opening Robert Swinckels –...


About this event

It is not possible anymore to register for this PiB day. We reach the max of 40.

 

PROGRAM

13.30 Arrival and registration     

14.00 Opening Robert Swinckels – Chairman PiB days DSPE
14.10 Introduction VDL ETG by CTO Gustaaf Savenije
14:20 Transition “Build-to-print” – “Build-to-spec” 
14.45 Technology Roadmapping in combination with System Architecture

15.15 Break
15.30 Case
16.00 Lab tour (demonstrations)
17:00 Drinks and snacks

 

 

 

 


8 October 2015



References

Lunch Lecture January hosted by…

The title is: Frame deformations control based on reduced order thermo-elastic models

Read more
Company visit YPN at Settels…

Our next company visit has been confirmed and will take place at Settels Savenije, located in Eindhoven, on Tuesday 17th of December. A perfect opportunity for networking just before Christmas.

Read more
Jan-Pieter Rijstenbil (TU Eindhoven) receives…

Prize for careful process analysis and early validation. During the 23rd edition of the Precision Fair in Den Bosch (NL), the Wim van der Hoek Award was presented under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more

References

Lunch Lecture January hosted by…

The title is: Frame deformations control based on reduced order thermo-elastic models

Read more
Company visit YPN at Settels…

Our next company visit has been confirmed and will take place at Settels Savenije, located in Eindhoven, on Tuesday 17th of December. A perfect opportunity for networking just before Christmas.

Read more
Jan-Pieter Rijstenbil (TU Eindhoven) receives…

Prize for careful process analysis and early validation. During the 23rd edition of the Precision Fair in Den Bosch (NL), the Wim van der Hoek Award was presented under the auspices of DSPE (Dutch Society for Precision Engineering).

Read more