EVENT 11 August 2020

Open Meeting Advanced Thermal Control consortium

High Tech Campus Eindhoven, 14:00 till 17:30   A group of leading industry and academics from the Dutch high tech sector took this initiatief. The group wishes to develop a...


About this event

High Tech Campus Eindhoven, 14:00 till 17:30

 

A group of leading industry and academics from the Dutch high tech sector took this initiatief.

The group wishes to develop a satellite network body for international expertise and interest in the field of Thermal Control.

Download the invitation with the program.

 

Contactperson: Walter Aarden at Philips.

 


25 February 2016



References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Read more
Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Read more
Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

Read more

References

Order of frictions and stiffnesses…

For lumped systems consisting of different frictions and stiffnesses, there has been confusion in literature about hysteresis curves and virtual play for many decades.

Read more
Make it clean

In mid-April, the second edition of the Manufacturing Technology Conference and the fifth edition of the Clean Event were held together, for the first time, at the Koningshof in Veldhoven (NL).

Read more
Bringing particles to light

Particle contamination monitoring and cleanliness control are fundamental to micromanufacturing processes across diverse industries to achieve cost-effective production of high-quality and reliable microscale devices and components.

Read more