Lunch Lecture October 4 hosted by VSL National Metrology Institute
Metrology for the Green Deal: characterization of Nanowire systems Nanowire systems show great potential as energy harvesting devices to create small amounts of electrical power and as electrode material for...

About this event
Metrology for the Green Deal: characterization of Nanowire systems
Nanowire systems show great potential as energy harvesting devices to create small amounts of electrical power and as electrode material for hydrogen generation. Due to the nanometer size dimensions of the wires and potentially large size of the entire devices there are a lot of challenges for measuring and characterization to enable optimization of device functionality and of production processes. This lecture will address some of the metrology challenges to realize accurate nanoscale measurement methods for these systems.
Date: October 4 we will start at 12:02pm
Speaker: Richard Koops, research scientist, VSL National Metrology Institute
If you would like to join this lecture please send an email to info@dspe.nl
References

The W.M. Keck Observatory telescopes on Hawaii are receiving upgrades that include an Adaptive Secondary Mirror (ASM) and the Keck Wide Field Imager (KWFI).
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In the rapidly evolving field of photonics, the integrity of photonic wafers is paramount to the performance and reliability of optical devices.
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In the area of precision engineering – where tolerances are measured in microns or even nanometers – additive manufacturing (AM) offers a new level of possibility.
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