Lunch Lecture October 4 hosted by VSL National Metrology Institute
Metrology for the Green Deal: characterization of Nanowire systems Nanowire systems show great potential as energy harvesting devices to create small amounts of electrical power and as electrode material for...
About this event
Metrology for the Green Deal: characterization of Nanowire systems
Nanowire systems show great potential as energy harvesting devices to create small amounts of electrical power and as electrode material for hydrogen generation. Due to the nanometer size dimensions of the wires and potentially large size of the entire devices there are a lot of challenges for measuring and characterization to enable optimization of device functionality and of production processes. This lecture will address some of the metrology challenges to realize accurate nanoscale measurement methods for these systems.
Date: October 4 we will start at 12:02pm
Speaker: Richard Koops, research scientist, VSL National Metrology Institute
If you would like to join this lecture please send an email to info@dspe.nl
References
Achieving ever higher accuracy in inspection and metrology depends on the interplay between light wavelength and advanced opto-mechatronic systems.
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