EVENT 7 February 2021

Lunch Lecture January hosted by VDL ETG

 By Hünkar Kemal Yurt, mechatronics system design engineer at VDL ETG VDL ETG is responsible to develop precise mechatronic handler systems for lithography machines which contain several 3 DOF SCARA...


About this event

 By Hünkar Kemal Yurt, mechatronics system design engineer at VDL ETG

VDL ETG is responsible to develop precise mechatronic handler systems for lithography machines which contain several 3 DOF SCARA type robots. These robots are mainly responsible for moving the payload between the modules with desired accuracy under high environmental vibration loads.

Hünkar will elaborate on how to calculate the position accuracy of the payload for different scenarios, using a validated Computer Aided Engineering (CAE) model for both frequency and time domain accuracy calculations.
When it comes to the performance of the robot, structural flexibility, driveline details, dissipation & friction and controller design are crucial details for the accuracy.

By using the Flexible Multi-Body Dynamic (FMBD) simulation approach which allows to perform efficient simulations in both frequency and time domains, a high- fidelity model is created for the robots by considering all crucial details.

The FMBD model is validated with respect to the measurement data on the physical prototype, and now it is being used for frequency and time domain accuracy calculations for special working scenarios by including the controller dynamic.

 


4 January 2021


The Netherlands

Digital


References

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References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more