EVENT 20 April 2021

Lunch Lecture May hosted by JPE – driven by innovation

This DSPE Lunch Lecture is hosted by JPE – Driven by innovation and has the title “Tackling thermal contacts – Estimation and measurement of thermal contact resistance”. The lecture will be...


About this event

This DSPE Lunch Lecture is hosted by JPE – Driven by innovation
and has the title “Tackling thermal contacts – Estimation and measurement of thermal contact resistance”. The lecture will be given by Evert Hooijkamp, mechanical engineer specialised in dynamic and thermal system design at JPE.

Tackling Thermal Contacts

Knowledge of thermal contacts is key in  predicting an application’s thermal behavior accurately and to ultimately fulfill demands in today’s high precision industry. Estimates to predict the impact of a thermal contact resistance are known from the literature. However, these estimates are often inaccurate due to extrapolation from limited data. We developed a test setup to measure the thermal contact resistance for contacts with low contact forces in vacuum. The results give great insight into the thermal contact of interest.

In this presentation, we will briefly overview some estimates from the literature. But we focus on contacts with low contact forces presenting our test setup, measurement method and results.

We will start at 12:03pm on May 3.

 

Interested to follow this lecture? Please, send an email to info@dspe.nl.


3 May 2021


The Netherlands

Digital


References

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References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more