EVENT 11 August 2020

Euspen International Conference & Exhibition

17th euspen‘s international conference and exhibition provides a leading forum for industrialists and academics alike to review the best of world-wide industrial innovation, progressive research and technology developments. Delegates will...


About this event

17th euspen‘s international conference and exhibition provides a leading forum for industrialists and academics alike to review the best of world-wide industrial innovation, progressive research and technology developments. Delegates will gain an insight into the precision engineering and nanotechnology priorities of Europe’s leading industrial nation.

 

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29 May 2017



References

Lunch Lecture April hosted by…

Theme: Concept optimization of system dynamics of a wafer metrology tool

Read more
Historical view on determinism and…

Paralleling the historical beginnings of modern science, assessing and addressing variation in physical systems constitutes the foundation of precision engineering. Tycho Brahe gave us the measurement data to analyse the heavens.

Read more
Sensor for picometer-scale positioning in…

As technology reaches the atomic and quantum scale, sub-nanometer motion control is no longer optional – it is a necessity, often in vacuum environments where even the smallest disturbances are effectively suppressed.

Read more

References

Lunch Lecture April hosted by…

Theme: Concept optimization of system dynamics of a wafer metrology tool

Read more
Historical view on determinism and…

Paralleling the historical beginnings of modern science, assessing and addressing variation in physical systems constitutes the foundation of precision engineering. Tycho Brahe gave us the measurement data to analyse the heavens.

Read more
Sensor for picometer-scale positioning in…

As technology reaches the atomic and quantum scale, sub-nanometer motion control is no longer optional – it is a necessity, often in vacuum environments where even the smallest disturbances are effectively suppressed.

Read more