EVENT 11 August 2020

Euspen 16th International Conference & Exhibition

euspen’s international conference and exhibition provides a leading forum for industrialists and academics alike to review the best of world-wide industrial innovation, progressive research and technology developments. Delegates will gain...


About this event

euspen’s international conference and exhibition provides a leading forum for industrialists and academics alike to review the best of world-wide industrial innovation, progressive research and technology developments. Delegates will gain an insight into the precision engineering and nanotechnology priorities of Europe’s leading industrial nation.

More information about the program via http://www.euspen.eu/OurEvents/Nottingham2016.aspx                  


30 May 2016



References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more

References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more