EVENT 11 August 2020

European Optical Society Biennial Meeting (EOSAM) 2018

Venue TU Delft Aula Conference Center, Delft, the Netherland   Important dates Submission timeframe: 1 December 2017- 15 April 2018 Informing authors about acceptance: 30 May 2018Detailed program: 30 July...


About this event

Venue

TU Delft Aula Conference Center, Delft, the Netherland

 

Important dates

Submission timeframe: 1 December 2017- 15 April 2018

Informing authors about acceptance: 30 May 2018
Detailed program: 30 July 2018

 

Netherlands is the hot spot for photonics in Europe and the strong optics research and industry in Delft makes it a perfect location to hold the upcoming symposium.
The meeting will once again include several topical meetings, tutorials, company visits, workshops, industrial exhibition, and more.

The Topical Meetings (TOMs) include
TOM 1- Silicon Photonics and Guided-Wave Optics
TOM 2- Freeform Optics for Illumination, AR and VR
TOM 3- Optical System Design, Tolerancing, and Manufacturing
TOM 4- Bio-Medical Optics
TOM 5- Metamaterials, Plasmonics and Resonant Nanophotonics
TOM 6- Frontiers in Optical Metrology
TOM 7- Organic & Hybrid Semiconductor Materials and Devices
TOM 8- Adaptive Optics & Information driven optical systems
TOM 9- Optical tapered fibers for light manipulation on the nanoscale – NEW

 

Special workshops and sessions
EU Project result dissemination Session
Grand Challenges of Photonics Session

 

The event is expected to gather nearly 400 people from Europe and all over the world.

Next to the conference and the work-shops there is an industrial exhibition from the 10th to the 11th of October. 

 

MORE INFORMATION

 

 


8 October 2018



References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

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Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

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References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more