EVENT 11 August 2020

Call for short abstracts

This will be the first Special Interest Group meeting on Precision Motion Systems & Control.


About this event

Special Interest Group Precision Motion Systems & Control

Location: NH Eindhoven Conference Centre, Koningshof Veldhoven, Netherlands (during the Precision Fair)

CALL FOR SHORT ABSTRACTS

The deadline to receive short abstracts has been extended until 29th June 2020.

Please submit your short abstract via the website of our partner euspen.

This will be the first Special Interest Group meeting on Precision Motion Systems & Control.

Precision motion systems and their control are key elements for precision engineering, both for manufacturing applications as well as for measuring instruments. From one-dimensional systems to complex multi-axis machines, components for linear and angular guides, actuation, measurement and control of motion are needed for precision positioning tasks. Increasing demands on the throughput of manufacturing systems and measuring instruments lead to the development of motion systems with higher dynamics and corresponding challenges for position control.

As a consequence, the research on and the development of precision motion components, systems and their control is a focus area for industry and academia.

The intensive on-going work in this field led us to bring together an internationally co-ordinated meeting. We are delighted to bring together leading expertise globally to an open forum for focused presentations and discussions on precision motion components, systems and control.

KEYNOTE

Prof. Hans Butler from ASML, Netherlands will be presenting at our meeting.

We look forward to his presentation on “Mechatronic challenges in optical lithography” where he introduces the latest solutions for making smaller features already in operation today, and also looks ahead to future systems.

The mechatronic challenges and solutions associated with these techniques will be addressed.

More information


16 November 2020

Deadline of submission is 29th June 2020

The Netherlands

NH Eindhoven Conference Centre


References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

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Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more

References

Fourfold ECP2 Bronze

This summer, four people were awarded a Bronze certificate from ECP2, a European certified precision engineering course programme that is a collaboration between euspen and DSPE.

Read more
Measuring (the refractive index of)…

Measuring nanoparticles becomes increasingly important in healthcare, pharmacology, and environmental sciences, but measuring and obtaining relevant information from single nanoparticles requires cutting-edge technology.

Read more
Minimising spherical aberrations

Temperature-controlled optical profilometry has historically been a difficult procedure due to imaging issues caused by spherical aberrations.

Read more