In the production of flexible electronics, such as organic LEDs or photo-voltaic foils, nanometer scale features critical to the device performance are often implemented. In-line 3D metrology of such profiles would revolutionize the production process by avoiding time consuming off-line measurements for process control. Achieving such measurements in a roll-2-roll environment is a precision challenge. In-line interferometry has been developed for this purpose delivering nanoscale accuracy on a moving flexible foil.

Speaker: Dr Theresa Spaan-Burke, Innovation Director, IBS Precision Engineering

This lecture will start at: May 6 on 12:02pm (Teams digital and only for members of the DSPE)

Please send an email to info@dspe.nl if you are interested in this Lunch lecture.