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On May 30th 13:00h, DSPE organizes a knowledge day on the topic ‘Beyond Nanometrology’. Speakers from industry will present real-life cases to show how to account for such factors, and even make them work for you.

This is an excellent opportunity for professionals in the nanometrology to come together and share their knowledge, experience, and research findings.

As technology progresses, requirements for the next generation of high tech systems and instruments become ever more strict. At the nano-scale, new physics comes into play. Accuracy of measurements becomes limited by factors such as the wavelength of light, finite stiffness of materials, and temperature becoming a statistical phenomenon rather than a bulk property.

This DSPE Knowledge Day will feature keynote speakers:


  • VSL | Walter Knulst | Interferometry for subnanometer drift displacement in opto-mechanical devices
  • Settels Savenije | Optical module with accurate rotation; design and realization
  • Thermo Fisher | Koos den Hollander | Metrology challenges when measuring on a nanometer scale
  • Nearfield Instruments | Mark Boerema | High Throughput, Angstrom Precision Metrology for Advance Semiconductor Chips manufacturing
  • MI - Partners | Mechatronic solutions on sub-nano scale
Location:
Settels Savenije, Achtseweg zuid 211
5651 GW Eindhoven
The Netherlands

Please register your attendance by sending an email to info@dspe.nl

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DSPE appoints Martin van den Brink as an honorary member

Martin reads the wafer.
Upon his retirement from ASML, Martin van den Brink was appointed honorary member of DSPE. Van den Brink joined ASML as an engineer in 1984, the year the Philips spin-out company was founded, and is now stepping down as co-president and chief technology officer. He is considered the godfather of the technological success of the lithography machine builder, says DSPE president Hans Krikhaar, explaining Van den Brink’s honorary membership. “Precision engineering, the field of work of our society, is an important pillar of that success. Without extremely accurate movement and positioning, ASML machines would not be able to deliver their impressive performance.”

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Mikroniek April issue: Progress in Actuator Technology

The April issue of Mikroniek is devoted to progress in actuator technology.
The main theme feature presents a 6-DoF-controlled magnetically levitated sample stage with an infinite rotation around the vertical axis and a stroke of 3 mm in three directions. Other theme articles include an actuator matrix design approach for over-actuated systems, TNO’s hybrid variable-reluctance actuator technology debuting on-sky, and an overview of piezo precision positioning principles. Also in this issue, a Rapid Learning Cycles pilot at VDL ETG and a report of euspen’s latest SIG Meeting on thermal issues.
click here for a first impression,

Check the new edition on Mikroniek online

YPN visits JPE on June 6th


The next YPN company visit will take place at Jansen Precision Engineering, located in Maastricht, on Thursday 6th of June 2024. As a leading center of expertise in precision engineering, JPE develop custom systems for high precision applications in high-tech machinery and scientific instrumentation, and cryogenic positioning products for scientific research. JPE is also widely known for their comprehensive bundle of engineering formulas: Precision Point..

Program:
13:30-13:45 Walk-in
13:45-14:00 Welcome & JPE introduction
14:00-14:40 Tech talk 1
14:40-15:20 Tech talk 2
15:20-15:40 Coffee break
15:40-16:20 Tech talk 3
16:20-17:00 Tour & Demos
17:00-18:00 Networking & Drinks

If you want to join this YPN event (free of charge) please send an email to info@dspe.nl.
JPE B.V.

FOR DSPE MEMBERS:

FREE ONLINE ACCESS TO DSPE’S JOURNAL MIKRONIEK

As from now, all editions of the Mikroniek journal are online accessible for employees
of DSPE members. This gives you - as employee of a DSPE member - the opportunity
to read the latest articles in the latest editions of our respected journal. Please spread the news at your office!


The newest issues are visible via the Mikroniek Online (for members only).

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Techcafé | Van hightech idee naar succesvolle business

Wanneer je een goed idee hebt voor de ontwikkeling van een hightech product, is dat nog geen garantie voor succes. Verschillende obstakels en uitdagingen kunnen onverwacht opduiken. Denk daarbij aan veelvoorkomende uitdagingen zoals technische complexiteit, kwaliteitsborging, regelgeving en een mogelijke schaarste aan middelen.

Onze genodigde tafelgasten zijn erin geslaagd succesvol een hightech product te ontwikkelen en op de markt te brengen. Ze delen interessante inzichten met je die je inspireren over onderwerpen als Research & Development en hoe om te gaan met product beperkingen, product afstemming en marktintroductie.
Dit zijn de bedrijven en de tafelgasten die je ontmoet:
  • Henk Tappel, directeur bij Bronkhorst High-Tech
  • Jacco Houter, 4Pico
  • Carbyon
  • Patrick Geerts, CCO en oprichter van MTA Group
Lees verder
Registreer hier
Rotating MagLev sample manipulator

In synchrotron beamlines, samples are analysed, while precisely positioned in the X-ray beam.Current systems typically use a set of stacked stages based on piezo or stepper motors. To enable higher throughput and performance, MI-Partners has developed a magnetically levitated sample stage.

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Actuator matrix design for over-actuated systems

High-tech positioning systems require high controller bandwidths and the decoupling of the various degrees of freedom (DoFs) to obtain the best system performance.

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Design Principles for Precision Mechatronics
DDPM: A collection of applications categorized in themes known from construction principles. In the coming year(s), we write a book and a website containing examples of precision mechatronics elements. DSPE members can contribute by writing clear examples to be freely used. Company and designer can be mentioned. Examples should no be complete systems.

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Hybrid variable-reluctance actuator technology on-sky

Astronomers use deformable mirrors to improve the image of a telescope by correcting for the optical distortions caused by atmospheric turbulence.
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