| 09:30 – 09:45 |
Welcome by the Chairman,
Olivier Rainaut, Director R&D Thermo Fisher Scientific |
| 09:45 – 10:15 |
Nicolae Catalin Podaru
Thermo Fisher
Electron microscopy: Principles, Electron Optics and Operating Modes
|
|
| 10:15 – 10:45 |
Diederik Maas
TNO
Aberration correction for Low-Voltage SEM in an Optomechatronical context
|
|
| 10:45 – 11:15 |
Break / visit to the exhibition
|
|
| 11:15 – 11:45 |
Martijn Maassen
ASML
The application of an electron optics system in a wafer inspection machine from ASML
|
|
| 11:45 – 12:15 |
Pleun Dona
Thermo Fisher
Laser Phase Plate and its Application in Transmission Electron Microscopy
|
|
| 12:15 – 13:30 |
Lunch / visit to exhibition |
| 13:30 – 14:00 |
Jacob Hoogenboom
TU Delft
Integrated microscopy with coincident electron, photon, and ion beams
|
|
| 14:00 -14:30 |
Dr. Aditya Narayanan
Raith
Level sensing in e-beam lithography
|
|
| 14:30 -15:00 |
René Cartaya López
Zeiss
Integration of Laser Interferometry r Vibration Sensing in Scanning Electron Microscopy
|
|
| 15:00 – 15:45 |
Break / visit to the exhibition |
| 15:45 – 16:15 |
Wilco Zuidema
Delmic
Optical Systems in a Multi-Beam Electron Microscope
|
|
| 16:15 – 16:45 |
Patrick de Jager
BIRDS
Groundbreaking technology to solve some of humanities toughest challenges
|
|
| 16:45 – 17:15 |
Conclusion of the day by chairman Olivier Rainaut
|
|
| 17:15 – 18:00 |
Drinks / snacks visit to exhibition |
| 18:00 |
|
| 18:00 – 20:00 |
Buffet (need registration) |
